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91 bytes added, 09:09, 21 February 2008
Links to XDS papers by Wolfgang Kabsch
[ ''J. Appl. Cryst.'' (1988). 21, 67-72. Automatic indexing of rotation diffraction patterns. ]
[ ''J. Appl. Cryst.'' (1988). 21, 916-924. Evaluation of single-crystal X-ray diffraction data from a position-sensitive detector]. This is ''the'' reference for the algorithms employed in the INTEGRATE and CORRECT steps.
[ ''J. Appl. Cryst.'' (1993). 26, 795-800. Automatic processing of rotation diffraction data from crystals of initially unknown symmetry and cell constants]. This is ''the'' reference for the IDXREF step.

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